JA

Jeffrey Bryan Abel

RS Rapiscan Systems: 6 patents #14 of 130Top 15%
Overall (All Time): #803,703 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12174334 Distributed analysis X-ray inspection methods and systems Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Siva Kumar, Joseph Bendahan 2024-12-24
11099294 Distributed analysis x-ray inspection methods and systems Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Siva Kumar, Joseph Bendahan 2021-08-24
10830920 Distributed analysis X-ray inspection methods and systems Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Siva Kumar, Joseph Bendahan 2020-11-10
10509142 Distributed analysis x-ray inspection methods and systems Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Siva Kumar, Joseph Bendahan 2019-12-17
10422919 X-ray inspection system that integrates manifest data with imaging/detection processing Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Siva Kumar, Joseph Bendahan 2019-09-24
9632206 X-ray inspection system that integrates manifest data with imaging/detection processing Shehul Sailesh Parikh, Balamurugan Sankaranarayaran, Siva Kumar, Joseph Bendahan 2017-04-25