Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174334 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2024-12-24 |
| 11099294 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2021-08-24 |
| 10830920 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2020-11-10 |
| 10509142 | Distributed analysis x-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2019-12-17 |
| 10422919 | X-ray inspection system that integrates manifest data with imaging/detection processing | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2019-09-24 |
| 9111331 | X-ray inspection system that integrates manifest data with imaging/detection processing | Shehul Sailesh Parikh, Jeffery Bryan Abel, Siva Kumar | 2015-08-18 |