LD

Larry A. DeWerd

RM Radiation Measurements: 1 patents #3 of 11Top 30%
SI Standard Imaging: 1 patents #8 of 18Top 45%
WARF: 1 patents #1,912 of 4,123Top 50%
📍 Madison, WI: #1,523 of 4,527 inventorsTop 35%
🗺 Wisconsin: #13,258 of 40,088 inventorsTop 35%
Overall (All Time): #1,443,110 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10525286 Compact sharpening filter for orthovoltage x-rays Jessica Fagerstrom, Edward Bender, Wesley Culberson, Michael W. Lawless, Benjamin R. M. Palmer 2020-01-07
8044365 High-resolution ion chamber Brian D. Hooten, Edward W. Neumueller 2011-10-25
4935950 Instrument for the measurement of x-ray beam characteristics Frank N. Ranallo, Joseph Muehlenkamp 1990-06-19