Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4935950 | Instrument for the measurement of x-ray beam characteristics | Larry A. DeWerd, Joseph Muehlenkamp | 1990-06-19 |
| 4697280 | Method and apparatus for the measurement of X-ray sources | William C. Zarnstorff | 1987-09-29 |