Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12130330 | Integrated circuit including constant-0 flip flops reconfigured to provide observable and controllable test points | Shwetha SHIVASHANKAR MURTHY | 2024-10-29 |
| 9740234 | On-chip clock controller | Hong Sun Kim, Anirudh Kadiyala | 2017-08-22 |
| 8627159 | Feedback scan isolation and scan bypass architecture | Kim S. Hong, Paul Bassett | 2014-01-07 |
| 8527825 | Debugger based memory dump using built in self test | Hong Sun Kim, Paul Bassett | 2013-09-03 |
| 8522097 | Logic built-in self-test programmable pattern bit mask | Hong Sun Kim, Paul Bassett | 2013-08-27 |