PN

Patrick James Noffke

QU Quadtech: 10 patents #6 of 80Top 8%
BA Baldwin Americas: 2 patents #7 of 8Top 90%
WA Welch Allyn: 1 patents #368 of 552Top 70%
Overall (All Time): #371,510 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11576617 Detecting artifacts in a signal David W. Mortara, Reyhaneh Sepehr 2023-02-14
10659660 Determination of tone value increase from a printed image John C. Seymour, Michael D. Sisco 2020-05-19
10187552 Determination of tone value increase from a printed image John C. Seymour, Michael D. Sisco 2019-01-22
9565339 Determination of tone value increase from a printed image John C. Seymour, Michael D. Sisco 2017-02-07
8817345 Image processing using multiple imaging devices 2014-08-26
8586956 Imaging an imprinted substrate on a printing press using an image sensor Eric C. Pearson, Mark R. Hansen, Bradly S. Moersfelder, John C. Seymour 2013-11-19
8441700 Image processing of a portion of multiple patches of a colorbar 2013-05-14
8183550 Imaging an imprinted substrate on a printing press Eric C. Pearson, Mark R. Hansen, Bradly S. Moersfelder, John C. Seymour 2012-05-22
8039826 Inspecting an imprinted substrate on a printing press Eric C. Pearson, Mark R. Hansen, Bradly S. Moersfelder, John C. Seymour 2011-10-18
7860278 Measuring color on a moving substrate Patrick Younk, Bradly S. Moersfelder 2010-12-28
7732796 Inspection system for inspecting an imprinted substrate on a printing press Eric C. Pearson, Mark R. Hansen, Bradly S. Moersfelder, John C. Seymour 2010-06-08
7627141 System and method for measuring color on a printing press Patrick Younk, Bradly S. Moersfelder 2009-12-01
7423280 Web inspection module including contact image sensors Eric C. Pearson, Mark R. Hansen, Bradly S. Moersfelder, John C. Seymour 2008-09-09