Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278940 | Automated inspection data collection for machine learning applications | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-04-15 |
| 12278941 | Automated sample weight measurement via optical inspection | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-04-15 |
| 12219117 | Automated sample weight measurement via optical inspection | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2025-02-04 |
| 12108020 | Automated sample weight measurement via optical inspection | Raf Peeters, Antoon De Cleen, Pieter Ieven | 2024-10-01 |