Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12418637 | Product target quality control system | Raf Peeters, Pieter Boogaerts, Jef de Busser, Simon Kerkhofs, Pieter Ieven | 2025-09-16 |
| 12309346 | Product target quality control system with intelligent sorting | Raf Peeters, Pieter Boogaerts, Jef de Busser, Simon Kerkhofs, Pieter Ieven | 2025-05-20 |
| 12278940 | Automated inspection data collection for machine learning applications | Raf Peeters, Pieter Ieven, Ruben Praets | 2025-04-15 |
| 12278941 | Automated sample weight measurement via optical inspection | Raf Peeters, Pieter Ieven, Ruben Praets | 2025-04-15 |
| 12219117 | Automated sample weight measurement via optical inspection | Raf Peeters, Pieter Ieven, Ruben Praets | 2025-02-04 |
| 12108020 | Automated sample weight measurement via optical inspection | Raf Peeters, Pieter Ieven, Ruben Praets | 2024-10-01 |