Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6694208 | Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devices | Chia-Yen Cha | 2004-02-17 |
| 6507800 | Method for testing semiconductor wafers | — | 2003-01-14 |