Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6694208 | Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devices | Shiow-Hwan Sheu | 2004-02-17 |
| 6274394 | Method and system for determining the fail patterns of fabricated wafers in automated wafer acceptance test | — | 2001-08-14 |