Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7200200 | X-ray fluorescence measuring system and methods for trace elements | Melvin J. Laurila | 2007-04-03 |
| 6130931 | X-ray fluorescence elemental analyzer | Melvin J. Laurila, Albert P. Klein | 2000-10-10 |