Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9103876 | Automatic probe configuration station and method therefor | Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Alexander Light, Steve Aochi +7 more | 2015-08-11 |
| 7714589 | Array test using the shorting bar and high frequency clock signal for the inspection of TFT-LCD with integrated driver IC | Mike Jun, Barry McGinley, Sabari Sanjeevi | 2010-05-11 |