Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5614675 | System and method for using phase differences to measure the thickness of an optical element | — | 1997-03-25 |
| 4584471 | Active translation sensor | — | 1986-04-22 |
| 4344160 | Automatic wafer focusing and flattening system | David A. Markle | 1982-08-10 |