Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit reliability assessment apparatus and method

Integrated circuit reliability assessment apparatus and method

US Patent 9977075 · Granted May 22, 2018

Estimated economic value: $37,728,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Gate dielectric for thin film oxide transistors2025
Technologies for dividing work across accelerator devices2025
Technologies for offloading acceleration task scheduling operations to accelerat2025
Technologies for dynamically managing resources in disaggregated accelerators2025
Managing data center resources to achieve a quality of service2024
Methods and apparatus to optimize a guard band of a hardware resource2024
System and method for material fingerprinting2024
Technologies for providing accelerated functions as a service in a disaggregated2024
Technologies for dividing work across accelerator devices2024
Technologies for dynamically managing resources in disaggregated accelerators2023
Self-directing node2023
Seamless and reliable chain of custody transfer over low power wireless protocol2023