Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measuring probe for non-destructive measuring of the thickness of thin layers

Measuring probe for non-destructive measuring of the thickness of thin layers

US Patent 9857171 · Granted Jan 2, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measuring system, measuring arrangement and method for determining measuring sig2024
Measuring device and detection of measurement signals during a penetrating movem2022
Measuring system, measuring arrangement, and method for determining measuring si2020
Measuring probe for non-destructive measuring of the thickness of thin layers2020
Method for electronic control of a measurement stand2017
Method for electronically activating a measurement stand, and measurement stand 2017
Measuring probe for measuring the thickness of thin layers, and method for the p2017
Hydraulic safety and movement control system2016
Measuring probe with shielding element for measuring the thickness of thin layer2016
Measuring probe for non-destructive measuring of the thickness of thin layers2015
Optoelectronic semiconductor device and method for producing an optoelectronic s2015
Electrolytically coated optoelectronic semiconductor component and method for pr2015