Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit containing first and second DOEs of standard cell compatible, NCEM-enabled fill cells, with the first DOE including via open configured fill cells, and the second DOE including merged-via configured fill cells

Integrated circuit containing first and second DOEs of standard cell compatible, NCEM-enabled fill cells, with the first DOE including via open configured fill cells, and the second DOE including merged-via configured fill cells

US Patent 9761502 · Granted Sep 12, 2017

Estimated economic value: $1,048,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems, devices, and methods for performing a non-contact electrical measuremen2025
Systems, devices, and methods for performing a non-contact electrical measuremen2025
Systems, devices, and methods for performing a non-contact electrical measuremen2025
Systems, devices, and methods for performing a non-contact electrical measuremen2025
Systems, devices, and methods for aligning a particle beam and performing a non-2025
Systems, devices, and methods for aligning a particle beam and performing a non-2025
Systems, devices, and methods for aligning a particle beam and performing a non-2025
Embedded system to characterize BTI degradation effects in MOSFETs2025
Embedded system to characterize BTI degradation effects in MOSFETs2025
Embedded system to characterize BTI degradation effects in MOSFETs2025
Systems, devices, and methods for performing a non-contact electrical measuremen2024
Systems, devices, and methods for performing a non-contact electrical measuremen2024