Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Oscillation circuit, integrated circuit, and abnormality detection method

Oscillation circuit, integrated circuit, and abnormality detection method

US Patent 9453881 · Granted Sep 27, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Power supply system2025
Electrical device and method of setting address2015
Semiconductor circuit, semiconductor device, method of diagnosing abnormality of2014
Signal processor and signal processing system2013
Method for unloading thermally treated non-planar silicon wafers with a conveyin2010
Semiconductor device to improve data retention characteristics of DRAM2008
Semiconductor integrated circuit2007
Microcontroller with multiple function blocks and clock signal control2006
Test circuit and multi-chip package type semiconductor device having the test ci2005
Test circuit and multi-chip package type semiconductor device having the test ci2005
Test circuit and multi-chip package type semiconductor device having the test ci2005
Test circuit and multi-chip package type semiconductor device having the test ci2005