Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Sputter neutral particle mass spectrometry apparatus with optical element

Sputter neutral particle mass spectrometry apparatus with optical element

US Patent 9431229 · Granted Aug 30, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Mass spectrometer and mass spectrometry method2021
Mass spectrometer and mass spectrometry method2021
Atom probe inspection device, field ion microscope, and distortion correction me2021
Mass spectrometer performing mass spectrometry for sample with laser irradiation2020
Mass spectrometer performing mass spectrometry for sample with laser irradiation2020
Scanning probe microscope and measurement method using the same2019
Analytical apparatus, sample holder and analytical method2017
Sputter neutral particle mass spectrometry apparatus2016
Material inspection apparatus and material inspection method2016
Sample structure analyzing method, transmission electron microscope, and compute2014
Sample analyzing apparatus and sample analyzing method2014
Paint composition, process for producing transparent protective film using the s2009