Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect injection for transistor-level fault simulation

Defect injection for transistor-level fault simulation

US Patent 9372946 · Granted Jun 21, 2016

Estimated economic value: $23,007,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Activity coverage assessment of circuit designs under test stimuli2022
Analog fault simulation control with multiple circuit representations2019
Circuit and method for measuring delays between edges of signals of a circuit2015
Circuit and method for simultaneously measuring multiple changes in delay2013
Circuit and method for measuring delay of high speed signals2008
Boundary scan with strobed pad driver enable2007
Circuit and method for measuring jitter of high speed signals2007
Circuit and method for adding parametric test capability to digital boundary sca2007
Method, system and program product for testing and/or diagnosing circuits using 2005
Circuit and method for testing high speed data circuits2005
Circuit and method for accurately applying a voltage to a node of an integrated 2005
Circuit and method for determining the location of defect in a circuit2004