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Home › Residual material detection in backdrilled stubs

Residual material detection in backdrilled stubs

US Patent 9341670 · Granted May 17, 2016

Estimated economic value: $3,602,000 ⓘ

Assignee

IBM

Inventors

Gerald K. Bartley (166 patents)
Darryl J. Becker (115 patents)
Matthew S. Doyle (154 patents)
Philip Raymond Germann (86 patents)
Mark O. Maxson (78 patents)

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