Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detection of defect in die

Detection of defect in die

US Patent 9291576 · Granted Mar 22, 2016

Estimated economic value: $9,243,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

TEC-embedded dummy die to cool the bottom die edge hotspot2025
Automatically executing application routines with user inputs2025
Thermally conductive slugs/active dies to improve cooling of stacked bottom dies2024
Integrated heat spreader (IHS) with heating element2023
Microelectronic assemblies including a thermal interface material2023
Method and device for failure analysis using RF-based thermometry2023
X-ray filter2022
X-ray filter2022
Method of sample preparation using dual ion beam trenching2022
Method, device and system for non-destructive detection of defects in a semicond2022
Method, device and system for non-destructive detection of defects in a semicond2022
Event-driven identity graph conflation2022