Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electron beam diagnostic system using computed tomography and an annular sensor

Electron beam diagnostic system using computed tomography and an annular sensor

US Patent 9105448 · Granted Aug 11, 2015

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

CTE-tuned pyrolytic graphite (PG) substrate to minimize joining stress between l2023
Si-based CTE-matched substrate for laser diode packaging2022
Vacuum manufacture of cryogenic pressure vessels for hydrogen storage2021
CTE-tuned pyrolytic graphite (PG) substrate to minimize joining stress between l2021
Angled slit design for computed tomographic imaging of electron beams2021
Angled slit design for computed tomographic imaging of electron beams2021
Concentric semi-circular split profiling for computed tomographic imaging of ele2020
Concentric semi-circular split profiling for computed tomographic imaging of ele2020
High flux diode packaging using passive microscale liquid-vapor phase change2017
Electron beam diagnostic system using computed tomography and an annular sensor2014
Electron beam diagnostic system using computed tomography and an annular sensor2014
Slit disk for modified faraday cup diagnostic for determining power density of e2011