Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10888284 | Angled slit design for computed tomographic imaging of electron beams | John W. Elmer | 2021-01-12 |
| 10649102 | Concentric semi-circular split profiling for computed tomographic imaging of electronic beams | John W. Elmer | 2020-05-12 |
| 9105448 | Electron beam diagnostic system using computed tomography and an annular sensor | John W. Elmer | 2015-08-11 |
| 8791426 | Electron beam diagnostic system using computed tomography and an annular sensor | John W. Elmer | 2014-07-29 |
| 7902503 | Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams | John W. Elmer, Todd Palmer | 2011-03-08 |
| 7378830 | Miniature modified Faraday cup for micro electron beams | John W. Elmer, Todd Palmer, Chris Walton | 2008-05-27 |
| 7348568 | Electron beam diagnostic for profiling high power beams | John W. Elmer, Todd Palmer | 2008-03-25 |
| 7288772 | Diagnostic system for profiling micro-beams | John W. Elmer, Todd Palmer, Chris Walton | 2007-10-30 |
| 7244950 | Trigger probe for determining the orientation of the power distribution of an electron beam | John W. Elmer, Todd Palmer | 2007-07-17 |
| 6300755 | Enhanced modified faraday cup for determination of power density distribution of electron beams | John W. Elmer | 2001-10-09 |
| 5583427 | Tomographic determination of the power distribution in electron beams | John W. Elmer | 1996-12-10 |
| 5554926 | Modified Faraday cup | John W. Elmer, Dennis O'Brien | 1996-09-10 |
| 5468966 | System for tomographic determination of the power distribution in electron beams | John W. Elmer, Dennis O'Brien | 1995-11-21 |
| 5382895 | System for tomographic determination of the power distribution in electron beams | John W. Elmer, Dennis O'Brien | 1995-01-17 |