Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test head and semiconductor wafer test apparatus comprising same

Test head and semiconductor wafer test apparatus comprising same

US Patent 8890558 · Granted Nov 18, 2014

Estimated economic value: $46,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Attachment apparatus, test head, and electronic device test system2010
Burn-in apparatus2007