Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8890558 | Test head and semiconductor wafer test apparatus comprising same | — | 2014-11-18 |
| 7746060 | Attachment apparatus, test head, and electronic device test system | Yoshimasa Ito | 2010-06-29 |
| 7271605 | Burn-in apparatus | Takashi Naitou | 2007-09-18 |