Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Extraction of imaging parameters for computational lithography using a data weighting algorithm

Extraction of imaging parameters for computational lithography using a data weighting algorithm

US Patent 8806388 · Granted Aug 12, 2014

Estimated economic value: $6,625,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Selecting optimum primary and secondary parameters to calibrate and generate an 2024
Network optimization2023
Method to improve transistor matching2019
CMOS-based thermopile with reduced thermal conductance2017
Method to improve transistor matching2017
CMOS-based thermopile with reduced thermal conductance2016
Computational lithography with feature upsizing2014
Transistor layout for manufacturing process control2013
OPC models generated from 2D high frequency test patterns2011
Transistor layout for manufacturing process control2011
Carbon nanotube transistors on a silicon or SOI substrate2010
Method for fabricating graphene transistors on a silicon or SOI substrate2010