Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Particle beam microscope for generating material data

Particle beam microscope for generating material data

US Patent 8766219 · Granted Jul 1, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Particle detector for detecting charged particles2025
Ascertaining the state of health of a vehicle battery2025
Drive device, optical system and lithography apparatus2025
Ionization device and mass spectrometer2024
Ion trap with ring-shaped ion storage cell and mass spectrometer2024
Mass spectrometer and method for analysing a gas by mass spectrometry2023
Device and method for tracking microscopic samples2022
Operating a particle beam device2021
Method for analyzing a gas by mass spectrometry, and mass spectrometer2021
Particle beam system and method of operating a particle beam system2021
Method for mass spectrometric examination of gas mixtures and mass spectrometer 2021
Electron beam microscope2020