Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern-height measuring apparatus and pattern-height measuring method

Pattern-height measuring apparatus and pattern-height measuring method

US Patent 8604431 · Granted Dec 10, 2013

Estimated economic value: $39,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device2025
Semiconductor device and method for manufacturing semiconductor device2025
Semiconductor device and method for manufacturing semiconductor device2025
Semiconductor device and method for manufacturing semiconductor device2024
Semiconductor device having plurality of insulators2024
Method for manufacturing semiconductor device2024
Semiconductor device2024
Display having sub-wavelength polygonal periodic elements2024
Semiconductor device including transistor and capacitor2023
Semiconductor device and method for manufacturing the semiconductor device2023
Semiconductor device having plurality of insulators2023
Oxide semiconductor device2023