Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Using in situ capacitance measurements to monitor the stability of interface materials in complex PCB assemblies and other structures

Using in situ capacitance measurements to monitor the stability of interface materials in complex PCB assemblies and other structures

US Patent 8589102 · Granted Nov 19, 2013

Estimated economic value: $3,686,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Heterogeneous integrated multi-chip cooler module2025
Active control for two-phase cooling2022
Wafer scale supercomputer2022
Traffic event recording and recreation2022
Energy efficiency based control for a cooling system2022
Energy efficient data center liquid cooling with geothermal enhancement2022
Circuit card attachment for enhanced robustness of thermal performance2022
Circuit card attachment for enhanced robustness of thermal performance2022
Module lid with embedded two-phase cooling and insulating layer2021
Detection of road surface defects2021
Thermal interface adhesion for transfer molded electronic components2021
Thermal interface adhesion for transfer molded electronic components2021