Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Statistical corner evaluation for complex on chip variation model

Statistical corner evaluation for complex on chip variation model

US Patent 8555222 · Granted Oct 8, 2013

Estimated economic value: $4,440,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method to compute timing yield and yield bottleneck using correlated sample gene2024
Serving multiple content items responsive to a single request2023
Analyzing delay variations and transition time variations for electronic circuit2022
Analyzing delay variations and transition time variations for electronic circuit2022
Analyzing delay variations and transition time variations for electronic circuit2020
Analyzing delay variations and transition time variations for electronic circuit2020
Circuit timing analysis2020
Serving multiple content items responsive to a single request2019
Analyzing delay variations and transition time variations for electronic circuit2019
Analyzing delay variations and transition time variations for electronic circuit2019
Augmented simulation method for waveform propagation in delay calculation2016
Pressure and acceleration based pedestrian impact sensor assembly for motor vehi2015