Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for detecting defects in wafer manufacturing

Apparatus and method for detecting defects in wafer manufacturing

US Patent 8532364 · Granted Sep 10, 2013

Estimated economic value: $8,150,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and arrangement for producing a surroundings map of a vehicle, textured w2025
Ultrasonic sensor arrangement for flow measurements having a coupling element2023
Transducer holding device for an ultrasonic flow measurement device2023
Method for operating a parking assistance system of a motor vehicle and parking 2022
Method and device for the localization of a vehicle from a fixed reference map2019
Controlling a surgical navigation system2018
Motor vehicle having a distance-related speed control system and having a lane d2018
Method for providing user-defined customization of a vehicle2018
Processing-context-dependent pseudonymization of security-critical medical data 2017
Controlling a surgical navigation system2017
Method and device for detecting objects in the surroundings of a vehicle2016
Communication device for a motor vehicle2016