Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for in-line quality control of wafers

Method and apparatus for in-line quality control of wafers

US Patent 8528407 · Granted Sep 10, 2013

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Inspection device and method2022
Method and apparatus for detecting cracks and delamination in composite material2018
Luminescence characterization of quantum dots conjugated with biomarkers for ear2010
Method of detecting and monitoring stresses in a semiconductor wafer2002