Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11506596 | Inspection device and method | Chad Rodrigues, Igor Vladimirovich Tarasov | 2022-11-22 |
| 9933394 | Method and apparatus for detecting cracks and delamination in composite materials | — | 2018-04-03 |
| 8528407 | Method and apparatus for in-line quality control of wafers | — | 2013-09-10 |
| 7655479 | Luminescence characterization of quantum dots conjugated with biomarkers for early cancer detection | Tatyana A. Zhukov, Rebecca Sutphen, Johnathan M. Lancaster, Thomas A. Sellers, Jin Zhang | 2010-02-02 |
| 6413789 | Method of detecting and monitoring stresses in a semiconductor wafer | — | 2002-07-02 |