Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electronic design automation tool and method for employing unsensitized critical path information to reduce leakage power in an integrated circuit

Electronic design automation tool and method for employing unsensitized critical path information to reduce leakage power in an integrated circuit

US Patent 8464198 · Granted Jun 11, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods, systems and apparatus for in-field testing for generic diagnostic compo2022
Test architecture for die to die interconnect for three dimensional integrated c2022
In-field system testing2020
In-field system test security2019
Data transformations to improve ROM yield and programming time2016
Low-cost design for register file testability2014
Victim port-based design for test area overhead reduction in multiport latch-bas2014
Scan cell designs with serial and parallel loading of test data2014
Stored-pattern logic self-testing with serial communication2013
Critical path monitor for an integrated circuit and method of operation thereof2013
Logic BIST for system testing using stored patterns2013
Timing error sampling generator and a method of timing testing2013