Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Optical inspection system with polarization isolation of detection system reflections

Optical inspection system with polarization isolation of detection system reflections

US Patent 8436997 · Granted May 7, 2013

Estimated economic value: $2,894,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optimized trotterization via multi-resolution analysis2016
Time dependent fluorescence measurements2010
Scatterometer-interferometer and method for detecting and distinguishing charact2010
Scatterometer-interferometer and method for detecting and distinguishing charact2010
Scatterometer-interferometer and method for detecting and distinguishing charact2010
Measuring time dependent fluorescence2009
Resonant ellipsometer and method for determining ellipsometric parameters of a s2008
Resonant ellipsometer and method for determining ellipsometric parameters of a s2008
Resonant ellipsometer and method for determining ellipsometric parameters of a s2008
Fabry-perot resonator apparatus and method including an in-resonator polarizing 2007
Fabry-perot resonator apparatus and method including an in-resonator polarizing 2007
Fabry-perot resonator apparatus and method including an in-resonator polarizing 2007