Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8436997 | Optical inspection system with polarization isolation of detection system reflections | Andrei Brunfeld, Bryan Clark | 2013-05-07 |
| 7671978 | Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts | Bryan Clark, Andrei Brunfeld | 2010-03-02 |
| 7330277 | Resonant ellipsometer and method for determining ellipsometric parameters of a surface | Andrei Brunfeld, Bryan Clark | 2008-02-12 |
| 7294825 | Fabry-perot resonator apparatus and method including an in-resonator polarizing element | Andrei Brunfeld, Bryan Clark | 2007-11-13 |
| 7282729 | Fabry-Perot resonator apparatus and method for observing low reflectivity surfaces | Brunfeld Andrei, Clark Bryan | 2007-10-16 |
| 7253891 | Method and apparatus for simultaneous 2-D and topographical inspection | Andrei Brunfeld, Ilia Lutsker | 2007-08-07 |
| 7220955 | Three-dimensional imaging resonator and method therefor | Andrei Brunfeld, Bryan Clark | 2007-05-22 |
| 7214932 | Resonator method and system for distinguishing characteristics of surface features or contaminants | Andrei Brunfeld, Bryan Clark | 2007-05-08 |
| 6294793 | High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor | Andrei Brunfeld, Joseph Shamir, Liviu Singher, Ilan Laver, Ely Pekel | 2001-09-25 |
| 6262432 | High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method therefor | Andrei Brunfeld, Joseph Shamir, Liviu Singher, Ilan Laver, Ely Pekel | 2001-07-17 |
| 6255666 | High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method therefor | Andrei Brunfeld, Joseph Shamir, Liviu Singher, Ilan Laver, Ely Pekel | 2001-07-03 |
| 6252242 | High speed optical inspection apparatus using Gaussian distribution analysis and method therefore | Andrei Brunfeld, Joseph Shamir, Liviu Singher, Ilan Laver, Ely Pekel | 2001-06-26 |
| 5638175 | Differential phase contrast inspection system with multiple detectors | Andrei Brunfeld, Zvi Yaniv, Ilan Laver | 1997-06-10 |
| 5459576 | Differential phase contrast inspection system | Andrei Brunfeld, Zvi Yaniv, Ilan Laver | 1995-10-17 |