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Home › Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation

Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation

US Patent 8283941 · Granted Oct 9, 2012

Estimated economic value: $682,000 ⓘ

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