Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Large-surface defect detection by single-frame spatial-carrier interferometry

Large-surface defect detection by single-frame spatial-carrier interferometry

US Patent 8275573 · Granted Sep 25, 2012

Estimated economic value: $5,535,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical measurement of lead angle of groove in manufactured part2017
Side illumination in interferometry2017
Signal sectioning for profiling printed-circuit-bord vias with vertical scanning2017
Optical plate for calibration of coordinate measuring machines2016
Full-color images produced by white-light interferometry2016
Full-color images produced by white-light interferometry2016
Signal sectioning for profiling printed-circuit-board vias with vertical scannin2015
Interferometric measurement of non-homogeneous multi-material surfaces2013
Interferometric measurement of non-homogeneous multi-material surfaces2013
Interferometric measurement of non-homogeneous multi-material surfaces2012
Polarization mirau interference microscope2011
Interferometric measurement of DLC layer on magnetic head2010