{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Apparatus and method for testing non-contact pads of a semiconductor device to be tested", "item": "https://www.patentleaderboard.com/patent/8253431"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for testing non-contact pads of a semiconductor device to be tested

Apparatus and method for testing non-contact pads of a semiconductor device to be tested

US Patent 8253431 · Granted Aug 28, 2012

Estimated economic value: $847,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Highlight moment detection for slow-motion videos2025
Semiconductor device package and method for manufacturing the same2025
Automatic tool setting system and method based on spectral confocal displacement2024
Optical device package with compatible lid and carrier2024
Filter element2024
Semiconductor package device and method of manufacturing the same2023
Optical device and electronic device2023
Semiconductor device package and method for manufacturing the same2023
Quasi-soft catcher, quasi-soft capture device, and method using the same2023
Microfluidic device2023
Catcher, capture device, and method for capturing target biological particle2022
Synchronous grinding-deburring method and system for valve spool based on measur2022