Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Universal array type probe card design for semiconductor device testing

Universal array type probe card design for semiconductor device testing

US Patent 8248091 · Granted Aug 21, 2012

Estimated economic value: $6,056,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and device for wafer-level testing2025
Method and system for wafer-level testing2025
Method and device for wafer-level testing2024
Method and system for wafer-level testing2024
Method and device for wafer-level testing2023
Method and system for wafer-level testing2023
Method and device for wafer-level testing2022
Method and system for wafer-level testing2021
Processing packet2021
Forwarding packet2020
Transmitting BGP message2020
Methods for monitoring paging messages with reduced power consumption and commun2019