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Home › Method for measuring thermo-optically induced material phase-change response in a multiple layer thin film structure using visible and ultraviolet spectroscopy

Method for measuring thermo-optically induced material phase-change response in a multiple layer thin film structure using visible and ultraviolet spectroscopy

US Patent 8111384 · Granted Feb 7, 2012

Estimated economic value: $8,181,000 ⓘ

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