Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

US Patent 8028567 · Granted Oct 4, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor memory device2025
Printing device and method for controlling printing device2025
Polymer, semiconductor composition comprising polymer, and method for manufactur2025
Robot2025
Air conditioning system including a platform with remote access to a main body o2025
Robotic lawn mower2025
Method for forming film on end-surface of laser diode bar2025
Portable electric chainsaw body2025
Dummy bar configured to align laser diode bar during deposition of film on end f2025
Washing machine and washing water supply device2025
Hand for robot2025
Robot2025