Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters

Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters

US Patent 7990158 · Granted Aug 2, 2011

Estimated economic value: $4,890,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Manufacturing a product using a soldering process2021
Discrete electronic device embedded in chip module2020
Discrete electronic device embedded in chip module2019
Method for embedding a discrete electrical device in a printed circuit board2018
Manufacturing a product using a soldering process2018
Discrete electronic device embedded in chip module2018
Embedding a discrete electrical device in a printed circuit board2017
Measuring power consumption in an integrated circuit2017
Discrete electronic device embedded in chip module2017
Manufacturing a product using a soldering process2016
Network power fault detection2015
Dense chevron finFET and method of manufacturing same2015