Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing a memory chip using a common node for multiple inputs and outputs

Method and apparatus for testing a memory chip using a common node for multiple inputs and outputs

US Patent 7877649 · Granted Jan 25, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for decoding of graph-based channel codes via reinforcement 2024
Communication efficient secret sharing2019
Asymmetric error correction and flash-memory rewriting using polar codes2019
Asynchronous wireless sensing2018
Torque-limiting assembly for a surgical powertool2018
Method for operating a sheet-forming unit, and sheet forming unit2013
Headbox for a machine for producing a fibrous web2012
Headbox for a machine for producing a fibrous web2012
Headbox for a machine for producing a fibrous web2012
Headbox for a machine for producing a fibrous web2012
Polymer concentrates with improved processability2010
Semiconductor memory device with temperature control2010