Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7877649 | Method and apparatus for testing a memory chip using a common node for multiple inputs and outputs | Joerg Kliewer, Manfred Proell, Stephan Schroeder, Georg Eggers, Wolfgang Ruf | 2011-01-25 |