Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Implementing at-speed Wafer Final Test (WFT) with complete chip coverage

Implementing at-speed Wafer Final Test (WFT) with complete chip coverage

US Patent 7852103 · Granted Dec 14, 2010

Estimated economic value: $5,212,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Spur detection in a sampled waveform in a mixed analog/digital system using the 2025
X-ray sensitive materials for data protection2024
X-ray sensitive materials for data protection2024
Creating inductors, resistors, capacitors and other structures in printed circui2024
Creating inductors, resistors, capacitors and other structures in printed circui2024
Secure hardware threat protection2023
Direct current blocking capacitors and method of attaching an IC package to a PC2023
Direct current blocking capacitors and method of attaching an IC package to a PC2023
Leakage characterization for electronic circuit temperature monitoring2023
Leakage characterization for electronic circuit temperature monitoring2023
Surface mount device placement to control a signal path in a printed circuit boa2022
Clock frequency adjustment for workload changes in integrated circuit devices2021