Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and apparatus for electrically testing lead-to-lead shorting during magnetoresistive sensor fabrication

System and apparatus for electrically testing lead-to-lead shorting during magnetoresistive sensor fabrication

US Patent 7737703 · Granted Jun 15, 2010

Estimated economic value: $66,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Current-perpendicular-to-the-plane (CPP) magnetoresistive (MR) sensor having a t2014
Technique for measuring process induced magnetic anisotropy in a magnetoresistiv2012
Wafer level balanced capacitance design for magnetic heads2012
Dynamic hard magnet thickness adjustment for reduced variation in free layer sta2011
Wafer level testing2011
Aerodynamic shapes for wafer structures to reduce damage caused by cleaning proc2010
Determination of magnetic read head properties2009
System, method, and apparatus for electrically testing lead-to-lead shorting dur2007
System, method, and apparatus for electrically testing lead-to-lead shorting dur2007
Determination of track width of magnetoresistive sensors during magnetic head fa2003