Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Technique for measuring process induced magnetic anisotropy in a magnetoresistive sensor

Technique for measuring process induced magnetic anisotropy in a magnetoresistive sensor

US Patent 8254066 · Granted Aug 28, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Stitched pole having a tapered tip2015
Perpendicular magnetic write head having a laminated trailing return pole2015
Shape enhanced pin read head magnetic transducer with stripe height defined firs2014
Current-perpendicular-to-the-plane (CPP) magnetoresistive (MR) sensor having a t2014
Current-perpendicular-to-the-plane (CPP) magnetoresistive (MR) sensor having a t2014
Magnetic write heads with bi-layer wrap around shields having dissimilar shield 2013
Perpendicular magnetic write head having a novel shield structure2013
Perpendicular magnetic write head with wrap-around shield, slanted pole and slan2013
Method for manufacturing a perpendicular magnetic write head having a tapered wr2013
PMR writer having a tapered write pole and bump layer and method of fabrication2012
Perpendicular magnetic recording system with magnetic precession for fast switch2012
Method for manufacturing a perpendicular magnetic write head2012