Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for improving incoming and outgoing wafer inspection productivity in a wafer reclaim factory

Apparatus for improving incoming and outgoing wafer inspection productivity in a wafer reclaim factory

US Patent 7727782 · Granted Jun 1, 2010

Estimated economic value: $13,547,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electrochromic window fabrication methods2025
Thin-film devices and fabrication2025
Spacers and connectors for insulated glass units2024
Spacers for insulated glass units2024
Spacers for insulated glass units2023
Thin-film devices and fabrication2023
Thin-film devices and fabrication2022
Electrochromic devices on non-rectangular shapes2022
Optical device fabrication2021
Electrochromic window fabrication methods2021
Electrochromic device including capping layer2021
Spacers and connectors for insulated glass units2021