Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for electronic testing of multiple memory devices

System and method for electronic testing of multiple memory devices

US Patent 7707468 · Granted Apr 27, 2010

Estimated economic value: $6,555,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Appliance remote control2023
Energy harvesting wireless sensing system2020
System, methods and apparatus using virtual appliances in a semiconductor test e2018
System, methods and apparatus using virtual appliances in a semiconductor test e2018
Methods, apparatus, and systems for contacting semiconductor dies that are elect2017
Solution for full speed, parallel DUT testing2016
Method and apparatus for massively parallel multi-wafer test2016
System, methods and apparatus using virtual appliances in a semiconductor test e2016
Wafer boat for semiconductor testing2015
System and method for electronic testing of partially processed devices2014
Test system and method for testing electronic devices using a pipelined testing 2013
Self-repair system and method for providing resource failure tolerance2012